TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_50_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-014-014-01 | FUSED_ID : 6359364768386572513
  IC_TEMP :  -54.97 | VDDM : 1131.66 | AUX_INT :   -6.97 | CsaBias :   75.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02998e-03 / 2
  ADC_P0  : -6.96607e-03 ± 2.17392e-02
  ADC_P1  : 8.29720e-03 ± 5.34029e-04
  ADC_P2  : -5.58962e-06 ± 2.58965e-06
  CSA_Chi2/NDF : 1.27311e-04 / 2
  CSA_P0  : 5.95461e-02 ± 7.52586e-03
  CSA_P1  : 9.84954e-03 ± 5.67019e-04
  CSA_P2  : -4.72140e-05 ± 8.63503e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  21
 | N_BROKEN_FAST :  [1, 8, 32, 34, 38, 40, 43, 44, 57, 66, 70, 83, 85, 87, 99, 103, 113, 114, 117, 118, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [29, 51, 57, 94, 97, 100, 112, 118, 119, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1716', '1.800', '0.1780', '1.800', '0.0915', '7.000', '0.7077', 1, 1, 1, 1, 1724705453.248569]
VI_after__Init : ['1.201', '0.1717', '1.800', '0.1780', '1.800', '0.0860', '7.000', '0.7072', 1, 1, 1, 1, 1724705460.8590946]
VI_at__the_End : ['1.201', '0.4886', '1.800', '0.1361', '1.800', '0.1124', '7.000', '0.7084', 1, 1, 1, 1, 1724705528.5198739]