TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_52_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-014-015-01 | FUSED_ID : 6359364768386572529
  IC_TEMP :  -51.28 | VDDM : 1127.36 | AUX_INT :   -8.63 | CsaBias :   81.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27791e-03 / 2
  ADC_P0  : -8.62605e-03 ± 2.42138e-02
  ADC_P1  : 8.26083e-03 ± 5.83545e-04
  ADC_P2  : -5.74224e-06 ± 2.78928e-06
  CSA_Chi2/NDF : 9.60638e-05 / 2
  CSA_P0  : 5.98471e-02 ± 6.53736e-03
  CSA_P1  : 9.52501e-03 ± 4.92543e-04
  CSA_P2  : -4.11112e-05 ± 7.50084e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [10, 17, 18, 32, 39, 42, 49, 53, 58, 59, 84, 90, 96, 110, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [1, 14, 17, 18, 39, 40, 50, 53, 60, 66, 73, 104, 106, 112, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2005', '1.800', '0.1396', '1.800', '0.0873', '7.000', '0.7077', 1, 1, 1, 1, 1724705549.465229]
VI_after__Init : ['1.202', '0.2005', '1.800', '0.1394', '1.800', '0.0820', '7.000', '0.7076', 1, 1, 1, 1, 1724705557.479723]
VI_at__the_End : ['1.201', '0.4928', '1.800', '0.1396', '1.808', '0.1115', '7.000', '0.7082', 1, 1, 1, 1, 1724705624.471546]