TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_57_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-014-018-06 | FUSED_ID : 6359364768386572582
  IC_TEMP :  -55.89 | VDDM : 1135.88 | AUX_INT :  -53.63 | CsaBias :   43.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30293e-03 / 2
  ADC_P0  : -5.36336e-02 ± 2.67248e-02
  ADC_P1  : 8.90085e-03 ± 6.36297e-04
  ADC_P2  : -7.64133e-06 ± 2.99608e-06
  CSA_Chi2/NDF : 1.64732e-04 / 2
  CSA_P0  : 5.92892e-02 ± 8.56074e-03
  CSA_P1  : 9.89610e-03 ± 6.44990e-04
  CSA_P2  : -4.76268e-05 ± 9.82244e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [4, 15, 28, 29, 47, 54, 76, 81, 96, 106, 120, 125, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [16, 27, 40, 50, 73, 75, 87, 89, 104, 107, 112, 119, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3958', '1.800', '0.1579', '1.799', '0.0929', '7.000', '0.7087', 1, 1, 1, 1, 1724705836.3572948]
VI_after__Init : ['1.201', '0.3962', '1.801', '0.1574', '1.800', '0.0856', '7.000', '0.7076', 1, 1, 1, 1, 1724705844.469662]
VI_at__the_End : ['1.201', '0.4912', '1.800', '0.1363', '1.799', '0.1138', '7.000', '0.7082', 1, 1, 1, 1, 1724705910.905584]