TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_01_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-014-021-06 | FUSED_ID : 6359364768386572630
  IC_TEMP :  -61.22 | VDDM : 1116.61 | AUX_INT :   -9.46 | CsaBias :   73.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49523e-03 / 2
  ADC_P0  : -9.46141e-03 ± 2.62193e-02
  ADC_P1  : 8.31363e-03 ± 6.36035e-04
  ADC_P2  : -5.67007e-06 ± 3.07101e-06
  CSA_Chi2/NDF : 1.97426e-04 / 2
  CSA_P0  : 5.96098e-02 ± 9.37183e-03
  CSA_P1  : 1.01685e-02 ± 7.06099e-04
  CSA_P2  : -5.40373e-05 ± 1.07531e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [1, 28, 44, 64, 74, 82, 84, 93, 96, 97, 122, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [5, 26, 39, 43, 61, 73, 82, 89, 98, 100, 112, 116, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4166', '1.800', '0.1482', '1.800', '0.0923', '7.000', '0.7076', 1, 1, 1, 1, 1724706117.535727]
VI_after__Init : ['1.201', '0.4166', '1.800', '0.1482', '1.801', '0.0870', '7.000', '0.7074', 1, 1, 1, 1, 1724706126.509039]
VI_at__the_End : ['1.201', '0.4793', '1.800', '0.1402', '1.808', '0.1153', '7.000', '0.7082', 1, 1, 1, 1, 1724706186.7703314]