TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_09_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-014-026-06 | FUSED_ID : 6359364768386572710
  IC_TEMP :  -69.67 | VDDM : 1161.21 | AUX_INT : -468.02 | CsaBias : -297.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.59478e-03 / 2
  ADC_P0  : -4.68022e-01 ± 6.89361e-02
  ADC_P1  : 1.58485e-02 ± 1.47849e-03
  ADC_P2  : -3.27041e-05 ± 6.31556e-06
  CSA_Chi2/NDF : 1.14855e-04 / 2
  CSA_P0  : 5.72818e-02 ± 7.14822e-03
  CSA_P1  : 9.79193e-03 ± 5.38567e-04
  CSA_P2  : -4.38403e-05 ± 8.20174e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [0, 15, 25, 29, 34, 43, 47, 64, 86, 87, 94, 106, 110, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [1, 3, 6, 16, 38, 57, 62, 69, 82, 93, 94, 96, 100, 104, 112, 124]
 | P_BROKEN_SLOW :  [0]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2120', '1.800', '0.1501', '1.800', '0.0857', '7.000', '0.7086', 1, 1, 1, 1, 1724706585.5458927]
VI_after__Init : ['1.201', '0.2120', '1.800', '0.1501', '1.800', '0.0791', '7.000', '0.7074', 1, 1, 1, 1, 1724706594.4011831]
VI_at__the_End : ['1.201', '0.4964', '1.800', '0.1359', '1.799', '0.1120', '7.000', '0.7084', 1, 1, 1, 1, 1724706654.9455225]