TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_43_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-015-005-12 | FUSED_ID : 6359364768386576476
  IC_TEMP :  -59.62 | VDDM : 1121.09 | AUX_INT :   -8.85 | CsaBias :   60.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35150e-03 / 2
  ADC_P0  : -8.85280e-03 ± 2.49165e-02
  ADC_P1  : 8.74785e-03 ± 6.37833e-04
  ADC_P2  : -6.25718e-06 ± 3.24457e-06
  CSA_Chi2/NDF : 2.07774e-04 / 2
  CSA_P0  : 5.77200e-02 ± 9.61431e-03
  CSA_P1  : 1.01619e-02 ± 7.24369e-04
  CSA_P2  : -5.46323e-05 ± 1.10313e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [4, 21, 29, 36, 57, 73, 76, 78, 84, 88, 92, 98, 99, 110, 111, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [33, 36, 62, 67, 83, 95, 101, 111, 114, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3239', '1.800', '0.1347', '1.800', '0.0877', '7.000', '0.7076', 1, 1, 1, 1, 1724708596.8102279]
VI_after__Init : ['1.201', '0.3242', '1.800', '0.1348', '1.799', '0.0817', '7.000', '0.7072', 1, 1, 1, 1, 1724708604.8965952]
VI_at__the_End : ['1.201', '0.4769', '1.800', '0.1386', '1.803', '0.1133', '7.000', '0.7084', 1, 1, 1, 1, 1724708673.5792017]