TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_35_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-015-010-12 | FUSED_ID : 6359364768386576556
  IC_TEMP :  -50.56 | VDDM : 1125.53 | AUX_INT :   -7.96 | CsaBias :   71.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23051e-03 / 2
  ADC_P0  : -7.96242e-03 ± 2.38357e-02
  ADC_P1  : 8.01357e-03 ± 5.77602e-04
  ADC_P2  : -4.24166e-06 ± 2.78726e-06
  CSA_Chi2/NDF : 1.32325e-04 / 2
  CSA_P0  : 5.87830e-02 ± 7.67262e-03
  CSA_P1  : 9.90408e-03 ± 5.78076e-04
  CSA_P2  : -4.83468e-05 ± 8.80342e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [3, 4, 5, 18, 24, 32, 43, 50, 63, 64, 78, 97, 98, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [15, 18, 21, 22, 38, 91, 97, 99, 104, 109, 119, 121, 123, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4036', '1.800', '0.1408', '1.800', '0.0975', '7.000', '0.7076', 1, 1, 1, 1, 1724708119.485934]
VI_after__Init : ['1.201', '0.4041', '1.800', '0.1408', '1.800', '0.0915', '7.000', '0.7076', 1, 1, 1, 1, 1724708127.596292]
VI_at__the_End : ['1.201', '0.4859', '1.800', '0.1348', '1.800', '0.1120', '7.000', '0.7083', 1, 1, 1, 1, 1724708194.2909963]