TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_32_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-015-012-12 | FUSED_ID : 6359364768386576588
  IC_TEMP :  -55.70 | VDDM : 1124.86 | AUX_INT :   -8.10 | CsaBias :   66.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07317e-03 / 2
  ADC_P0  : -8.09640e-03 ± 2.21636e-02
  ADC_P1  : 8.36546e-03 ± 5.40380e-04
  ADC_P2  : -5.99883e-06 ± 2.61083e-06
  CSA_Chi2/NDF : 1.30069e-04 / 2
  CSA_P0  : 5.70074e-02 ± 7.60692e-03
  CSA_P1  : 9.77865e-03 ± 5.73126e-04
  CSA_P2  : -4.66229e-05 ± 8.72803e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [22, 30, 33, 37, 42, 51, 57, 64, 82, 83, 99, 104, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [10, 38, 44, 45, 57, 66, 67, 75, 76, 93, 97, 98, 99, 114, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3265', '1.800', '0.1648', '1.800', '0.0930', '7.000', '0.7076', 1, 1, 1, 1, 1724707928.0543268]
VI_after__Init : ['1.201', '0.3267', '1.800', '0.1646', '1.800', '0.0871', '7.000', '0.7075', 1, 1, 1, 1, 1724707936.3016517]
VI_at__the_End : ['1.201', '0.4840', '1.800', '0.1378', '1.800', '0.1134', '7.000', '0.7083', 1, 1, 1, 1, 1724707995.2668295]