TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_28_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-015-014-12 | FUSED_ID : 6359364768386576620
  IC_TEMP :  -54.10 | VDDM : 1119.02 | AUX_INT :   -9.11 | CsaBias :   71.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44367e-03 / 2
  ADC_P0  : -9.11085e-03 ± 2.57729e-02
  ADC_P1  : 8.13687e-03 ± 6.15957e-04
  ADC_P2  : -5.26865e-06 ± 2.92904e-06
  CSA_Chi2/NDF : 1.52327e-04 / 2
  CSA_P0  : 5.80197e-02 ± 8.23210e-03
  CSA_P1  : 9.69807e-03 ± 6.20229e-04
  CSA_P2  : -4.60469e-05 ± 9.44536e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [9, 15, 40, 49, 67, 73, 86, 91, 99, 100, 101, 112, 122, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [2, 13, 34, 68, 94, 99, 100, 103, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1648', '1.800', '0.1572', '1.800', '0.0898', '7.000', '0.7074', 1, 1, 1, 1, 1724707735.8390017]
VI_after__Init : ['1.201', '0.1648', '1.800', '0.1573', '1.800', '0.0841', '7.000', '0.7075', 1, 1, 1, 1, 1724707743.9733744]
VI_at__the_End : ['1.201', '0.4842', '1.800', '0.1359', '1.800', '0.1123', '7.000', '0.7086', 1, 1, 1, 1, 1724707801.047624]