TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_24_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-015-017-11 | FUSED_ID : 6359364768386576667
  IC_TEMP :  -52.53 | VDDM : 1125.09 | AUX_INT :  -83.21 | CsaBias :    0.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21395e-03 / 2
  ADC_P0  : -8.32101e-02 ± 2.72972e-02
  ADC_P1  : 9.34830e-03 ± 6.43738e-04
  ADC_P2  : -9.20375e-06 ± 2.99343e-06
  CSA_Chi2/NDF : 1.62315e-04 / 2
  CSA_P0  : 5.90425e-02 ± 8.49770e-03
  CSA_P1  : 9.96201e-03 ± 6.40240e-04
  CSA_P2  : -4.97514e-05 ± 9.75010e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [13, 21, 28, 35, 38, 41, 60, 72, 108, 109, 111, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [6, 11, 18, 19, 32, 34, 47, 78, 84, 91, 117, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1995', '1.800', '0.1612', '1.800', '0.0832', '7.000', '0.7077', 1, 1, 1, 1, 1724707447.7638106]
VI_after__Init : ['1.201', '0.1995', '1.800', '0.1613', '1.799', '0.0777', '7.000', '0.7078', 1, 1, 1, 1, 1724707455.861149]
VI_at__the_End : ['1.201', '0.4871', '1.800', '0.1370', '1.809', '0.1130', '7.000', '0.7083', 1, 1, 1, 1, 1724707512.5016677]