TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_16_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-015-022-11 | FUSED_ID : 6359364768386576747
  IC_TEMP :  -47.19 | VDDM : 1203.78 | AUX_INT : -1081.99 | CsaBias : -772.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.94252e-02 / 2
  ADC_P0  : -1.08199e+00 ± 5.19660e-01
  ADC_P1  : 2.28412e-02 ± 9.02648e-03
  ADC_P2  : -5.32409e-05 ± 3.28099e-05
  CSA_Chi2/NDF : 8.36898e-05 / 2
  CSA_P0  : 5.71707e-02 ± 6.10181e-03
  CSA_P1  : 9.25416e-03 ± 4.59727e-04
  CSA_P2  : -3.73580e-05 ± 7.00110e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [4, 9, 23, 26, 30, 35, 37, 45, 50, 55, 82, 85, 92, 101, 104, 111, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [8, 15, 21, 25, 27, 42, 67, 85, 102, 107, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1174', '1.800', '0.1506', '1.799', '0.0778', '7.000', '0.7077', 1, 1, 1, 1, 1724706968.3905237]
VI_after__Init : ['1.201', '0.1174', '1.800', '0.1505', '1.802', '0.0725', '7.000', '0.7075', 1, 1, 1, 1, 1724706976.486883]
VI_at__the_End : ['1.201', '0.4869', '1.800', '0.1333', '1.804', '0.1112', '7.000', '0.7084', 1, 1, 1, 1, 1724707041.5278401]