TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_14_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-015-023-11 | FUSED_ID : 6359364768386576763
  IC_TEMP :  -53.84 | VDDM : 1125.18 | AUX_INT :   -9.00 | CsaBias :   79.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40241e-03 / 2
  ADC_P0  : -9.00399e-03 ± 2.54020e-02
  ADC_P1  : 8.12429e-03 ± 6.07093e-04
  ADC_P2  : -5.20634e-06 ± 2.88689e-06
  CSA_Chi2/NDF : 1.06586e-04 / 2
  CSA_P0  : 5.86413e-02 ± 6.88607e-03
  CSA_P1  : 9.37924e-03 ± 5.18816e-04
  CSA_P2  : -3.95347e-05 ± 7.90095e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [10, 25, 26, 27, 43, 55, 66, 69, 72, 78, 87, 90, 94, 102, 103, 105, 120, 121, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [6, 30, 32, 37, 39, 53, 60, 82, 96, 109, 110, 112, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3810', '1.800', '0.1256', '1.800', '0.1019', '7.000', '0.7076', 1, 1, 1, 1, 1724706872.6068194]
VI_after__Init : ['1.201', '0.3809', '1.800', '0.1256', '1.801', '0.0961', '7.000', '0.7074', 1, 1, 1, 1, 1724706880.7782435]
VI_at__the_End : ['1.201', '0.4890', '1.800', '0.1339', '1.803', '0.1128', '7.000', '0.7084', 1, 1, 1, 1, 1724706940.698566]