TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_46_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-016-006-04 | FUSED_ID : 6359364768386580580
  IC_TEMP :  -55.56 | VDDM : 1102.58 | AUX_INT :   -8.39 | CsaBias :   59.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26642e-03 / 2
  ADC_P0  : -8.38608e-03 ± 2.41293e-02
  ADC_P1  : 8.53867e-03 ± 6.08045e-04
  ADC_P2  : -5.71988e-06 ± 3.04371e-06
  CSA_Chi2/NDF : 1.88003e-04 / 2
  CSA_P0  : 5.84189e-02 ± 9.14544e-03
  CSA_P1  : 1.01677e-02 ± 6.89043e-04
  CSA_P2  : -5.29941e-05 ± 1.04933e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [9, 10, 14, 37, 56, 59, 62, 71, 81, 82, 98, 104, 106, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [20, 22, 30, 35, 38, 40, 74, 77, 81, 82, 106, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1876', '1.800', '0.1491', '1.800', '0.0901', '7.000', '0.7076', 1, 1, 1, 1, 1724708787.5772073]
VI_after__Init : ['1.201', '0.1876', '1.800', '0.1490', '1.800', '0.0842', '7.000', '0.7076', 1, 1, 1, 1, 1724708796.3025286]
VI_at__the_End : ['1.201', '0.4841', '1.800', '0.1377', '1.800', '0.1135', '7.000', '0.7081', 1, 1, 1, 1, 1724708864.0942183]