TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_48_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-016-007-04 | FUSED_ID : 6359364768386580596
  IC_TEMP :  -54.18 | VDDM : 1118.42 | AUX_INT :   -8.99 | CsaBias :   81.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45608e-03 / 2
  ADC_P0  : -8.98554e-03 ± 2.58929e-02
  ADC_P1  : 8.27849e-03 ± 6.31493e-04
  ADC_P2  : -5.37878e-06 ± 3.06330e-06
  CSA_Chi2/NDF : 1.29441e-04 / 2
  CSA_P0  : 6.05260e-02 ± 7.58854e-03
  CSA_P1  : 9.50937e-03 ± 5.71742e-04
  CSA_P2  : -4.32436e-05 ± 8.70695e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [1, 14, 16, 23, 27, 28, 34, 37, 57, 62, 66, 83, 100, 105, 106, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [0, 12, 15, 16, 40, 53, 62, 64, 81, 96, 100, 105, 123, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3096', '1.800', '0.1474', '1.800', '0.0919', '7.000', '0.7084', 1, 1, 1, 1, 1724708884.2296638]
VI_after__Init : ['1.201', '0.3096', '1.800', '0.1475', '1.800', '0.0843', '7.000', '0.7076', 1, 1, 1, 1, 1724708892.3341537]
VI_at__the_End : ['1.201', '0.4840', '1.802', '0.1380', '1.800', '0.1122', '7.000', '0.7083', 1, 1, 1, 1, 1724708956.7310748]