TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_49_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-016-008-04 | FUSED_ID : 6359364768386580612
  IC_TEMP :  -56.73 | VDDM : 1112.93 | AUX_INT :  -10.07 | CsaBias :   72.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.86747e-03 / 2
  ADC_P0  : -1.00662e-02 ± 2.94057e-02
  ADC_P1  : 8.33029e-03 ± 7.30837e-04
  ADC_P2  : -4.69952e-06 ± 3.63656e-06
  CSA_Chi2/NDF : 1.83557e-04 / 2
  CSA_P0  : 6.00297e-02 ± 9.03665e-03
  CSA_P1  : 1.01059e-02 ± 6.80846e-04
  CSA_P2  : -5.29171e-05 ± 1.03685e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [2, 3, 12, 18, 26, 27, 33, 35, 53, 57, 66, 76, 108, 113, 115, 117, 122, 125, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [0, 5, 22, 25, 26, 28, 46, 79, 93, 98, 107, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3212', '1.800', '0.1485', '1.800', '0.0912', '7.000', '0.7076', 1, 1, 1, 1, 1724708979.7812912]
VI_after__Init : ['1.201', '0.3213', '1.800', '0.1485', '1.800', '0.0853', '7.000', '0.7075', 1, 1, 1, 1, 1724708988.5265]
VI_at__the_End : ['1.201', '0.4818', '1.800', '0.1368', '1.803', '0.1145', '7.000', '0.7084', 1, 1, 1, 1, 1724709048.0999653]