TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_52_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-016-010-04 | FUSED_ID : 6359364768386580644
  IC_TEMP :  -54.21 | VDDM : 1128.80 | AUX_INT :   -7.08 | CsaBias :   69.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.51905e-04 / 2
  ADC_P0  : -7.08414e-03 ± 1.97511e-02
  ADC_P1  : 8.57835e-03 ± 5.02053e-04
  ADC_P2  : -5.79101e-06 ± 2.52939e-06
  CSA_Chi2/NDF : 1.78685e-04 / 2
  CSA_P0  : 6.03717e-02 ± 8.91592e-03
  CSA_P1  : 1.03134e-02 ± 6.71750e-04
  CSA_P2  : -5.34866e-05 ± 1.02300e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [1, 17, 22, 33, 74, 76, 78, 92, 94, 100, 110, 116, 119, 122, 126]
 | N_BROKEN_SLOW :  [74]
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [13, 34, 35, 47, 50, 59, 73, 74, 79, 81, 86, 89, 118, 126]
 | P_BROKEN_SLOW :  [74]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4573', '1.800', '0.1516', '1.799', '0.1005', '7.000', '0.7086', 1, 1, 1, 1, 1724709171.8883152]
VI_after__Init : ['1.201', '0.4582', '1.799', '0.1518', '1.801', '0.0921', '7.000', '0.7077', 1, 1, 1, 1, 1724709179.998701]
VI_at__the_End : ['1.201', '0.4930', '1.800', '0.1396', '1.799', '0.1133', '7.000', '0.7083', 1, 1, 1, 1, 1724709246.9263723]