TEST_NAME : Wafer
TEST_DATE : 24_08_26-23_54_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-016-011-04 | FUSED_ID : 6359364768386580660
  IC_TEMP :  -50.33 | VDDM : 1121.79 | AUX_INT :   -8.71 | CsaBias :   69.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33672e-03 / 2
  ADC_P0  : -8.70941e-03 ± 2.48002e-02
  ADC_P1  : 7.81750e-03 ± 5.72748e-04
  ADC_P2  : -4.69913e-06 ± 2.63183e-06
  CSA_Chi2/NDF : 1.16081e-04 / 2
  CSA_P0  : 5.63380e-02 ± 7.18625e-03
  CSA_P1  : 9.40779e-03 ± 5.41432e-04
  CSA_P2  : -4.14574e-05 ± 8.24537e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [5, 11, 12, 40, 42, 44, 82, 89, 92, 112, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [6, 9, 20, 43, 56, 65, 67, 76, 86, 88, 94, 109, 116, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2314', '1.800', '0.1115', '1.799', '0.0838', '7.000', '0.7076', 1, 1, 1, 1, 1724709267.885854]
VI_after__Init : ['1.201', '0.2314', '1.800', '0.1116', '1.800', '0.0784', '7.000', '0.7074', 1, 1, 1, 1, 1724709276.0752316]
VI_at__the_End : ['1.201', '0.4786', '1.800', '0.1328', '1.804', '0.1121', '7.000', '0.7083', 1, 1, 1, 1, 1724709342.1910276]