TEST_NAME : Wafer
TEST_DATE : 24_08_27-00_02_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-016-016-03 | FUSED_ID : 6359364768386580739
  IC_TEMP :  -52.02 | VDDM : 1104.07 | AUX_INT :   -9.36 | CsaBias :   79.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34088e-03 / 2
  ADC_P0  : -9.35737e-03 ± 2.47843e-02
  ADC_P1  : 8.14743e-03 ± 5.84188e-04
  ADC_P2  : -5.68706e-06 ± 2.74038e-06
  CSA_Chi2/NDF : 1.19578e-04 / 2
  CSA_P0  : 5.93235e-02 ± 7.29369e-03
  CSA_P1  : 9.53433e-03 ± 5.49527e-04
  CSA_P2  : -4.23376e-05 ± 8.36864e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [4, 15, 22, 24, 26, 33, 40, 49, 56, 65, 70, 92, 97, 99, 103, 105, 107, 109, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [1, 16, 36, 38, 53, 55, 59, 93, 102, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2196', '1.800', '0.1460', '1.800', '0.0871', '7.000', '0.7072', 1, 1, 1, 1, 1724709746.9773083]
VI_after__Init : ['1.201', '0.2196', '1.800', '0.1460', '1.801', '0.0814', '7.000', '0.7075', 1, 1, 1, 1, 1724709755.7526753]
VI_at__the_End : ['1.202', '0.4892', '1.800', '0.1370', '1.801', '0.1125', '7.000', '0.7083', 1, 1, 1, 1, 1724709822.5296395]