TEST_NAME : Wafer
TEST_DATE : 24_08_27-00_04_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-016-017-03 | FUSED_ID : 6359364768386580755
  IC_TEMP :  -51.78 | VDDM : 1124.67 | AUX_INT :   -8.78 | CsaBias :   79.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25068e-03 / 2
  ADC_P0  : -8.78395e-03 ± 2.39536e-02
  ADC_P1  : 8.10185e-03 ± 5.67587e-04
  ADC_P2  : -5.35956e-06 ± 2.67467e-06
  CSA_Chi2/NDF : 9.61889e-05 / 2
  CSA_P0  : 5.85987e-02 ± 6.54161e-03
  CSA_P1  : 9.18853e-03 ± 4.92863e-04
  CSA_P2  : -3.84311e-05 ± 7.50572e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [2, 4, 41, 45, 50, 51, 65, 78, 92, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [1, 9, 12, 17, 30, 31, 36, 51, 52, 96, 100, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3076', '1.800', '0.1340', '1.800', '0.0912', '7.000', '0.7084', 1, 1, 1, 1, 1724709843.3791225]
VI_after__Init : ['1.202', '0.3078', '1.800', '0.1341', '1.800', '0.0838', '7.000', '0.7075', 1, 1, 1, 1, 1724709851.583485]
VI_at__the_End : ['1.201', '0.4822', '1.799', '0.1354', '1.799', '0.1115', '7.000', '0.7084', 1, 1, 1, 1, 1724709912.040846]