TEST_NAME : Wafer
TEST_DATE : 24_08_27-00_07_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-016-019-03 | FUSED_ID : 6359364768386580787
  IC_TEMP :  -56.52 | VDDM : 1133.98 | AUX_INT : -119.19 | CsaBias :  -21.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.27380e-03 / 2
  ADC_P0  : -1.19188e-01 ± 3.99209e-02
  ADC_P1  : 9.92214e-03 ± 9.37625e-04
  ADC_P2  : -1.07483e-05 ± 4.36092e-06
  CSA_Chi2/NDF : 1.37814e-04 / 2
  CSA_P0  : 5.80290e-02 ± 7.83012e-03
  CSA_P1  : 9.75494e-03 ± 5.89943e-04
  CSA_P2  : -4.86403e-05 ± 8.98413e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [15, 20, 30, 58, 61, 67, 99, 101, 105, 110, 115, 117, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [7, 9, 18, 42, 45, 46, 48, 67, 77, 86, 105, 110, 111, 118, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3739', '1.800', '0.1387', '1.800', '0.0936', '7.000', '0.7083', 1, 1, 1, 1, 1724710034.8756697]
VI_after__Init : ['1.201', '0.3742', '1.800', '0.1387', '1.800', '0.0859', '7.000', '0.7076', 1, 1, 1, 1, 1724710043.0520046]
VI_at__the_End : ['1.201', '0.4776', '1.800', '0.1345', '1.800', '0.1145', '7.000', '0.7083', 1, 1, 1, 1, 1724710108.4450247]