TEST_NAME : Wafer
TEST_DATE : 24_08_27-00_10_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-016-021-03 | FUSED_ID : 6359364768386580819
  IC_TEMP :  -52.43 | VDDM : 1120.52 | AUX_INT :   -7.49 | CsaBias :   77.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23321e-03 / 2
  ADC_P0  : -7.49156e-03 ± 2.38472e-02
  ADC_P1  : 7.74083e-03 ± 5.54633e-04
  ADC_P2  : -4.31723e-06 ± 2.55738e-06
  CSA_Chi2/NDF : 9.83900e-05 / 2
  CSA_P0  : 5.66256e-02 ± 6.61604e-03
  CSA_P1  : 9.04943e-03 ± 4.98471e-04
  CSA_P2  : -3.72815e-05 ± 7.59112e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [5, 9, 24, 33, 37, 52, 58, 70, 71, 81, 82, 93, 103, 105, 114, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [3, 6, 17, 25, 31, 34, 40, 44, 61, 62, 81, 85, 88, 89, 96, 113, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4403', '1.800', '0.1076', '1.800', '0.0956', '7.000', '0.7074', 1, 1, 1, 1, 1724710226.3911273]
VI_after__Init : ['1.201', '0.4407', '1.800', '0.1076', '1.800', '0.0901', '7.000', '0.7074', 1, 1, 1, 1, 1724710234.4494812]
VI_at__the_End : ['1.201', '0.4753', '1.800', '0.1344', '1.799', '0.1133', '7.000', '0.7083', 1, 1, 1, 1, 1724710295.3277812]