TEST_NAME : Wafer
TEST_DATE : 24_08_27-00_12_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-016-022-03 | FUSED_ID : 6359364768386580835
  IC_TEMP :  -56.01 | VDDM : 1120.83 | AUX_INT :  -10.35 | CsaBias :   70.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.80202e-03 / 2
  ADC_P0  : -1.03477e-02 ± 2.87759e-02
  ADC_P1  : 8.12085e-03 ± 6.70902e-04
  ADC_P2  : -5.83358e-06 ± 3.11177e-06
  CSA_Chi2/NDF : 8.72585e-05 / 2
  CSA_P0  : 5.61311e-02 ± 6.23055e-03
  CSA_P1  : 9.17460e-03 ± 4.69427e-04
  CSA_P2  : -3.71001e-05 ± 7.14882e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [4, 11, 31, 34, 57, 60, 63, 72, 75, 88, 95, 105, 109, 111, 115, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [0, 3, 13, 15, 16, 42, 45, 46, 57, 82, 85, 92, 94, 96, 100, 102, 106, 113, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.0901', '1.800', '0.1297', '1.799', '0.0820', '7.000', '0.7074', 1, 1, 1, 1, 1724710321.5906916]
VI_after__Init : ['1.201', '0.0901', '1.800', '0.1296', '1.801', '0.0763', '7.000', '0.7074', 1, 1, 1, 1, 1724710330.49613]
VI_at__the_End : ['1.201', '0.4826', '1.800', '0.1339', '1.800', '0.1123', '7.000', '0.7085', 1, 1, 1, 1, 1724710390.2005596]