TEST_NAME : Wafer
TEST_DATE : 24_08_27-00_13_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-016-023-03 | FUSED_ID : 6359364768386580851
  IC_TEMP :  -55.75 | VDDM : 1129.50 | AUX_INT :   -6.54 | CsaBias :   75.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.16802e-04 / 2
  ADC_P0  : -6.54220e-03 ± 1.93298e-02
  ADC_P1  : 8.25487e-03 ± 4.70714e-04
  ADC_P2  : -5.70103e-06 ± 2.26177e-06
  CSA_Chi2/NDF : 1.11128e-04 / 2
  CSA_P0  : 5.71748e-02 ± 7.03127e-03
  CSA_P1  : 9.56428e-03 ± 5.29756e-04
  CSA_P2  : -4.01688e-05 ± 8.06755e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [20, 26, 37, 44, 68, 69, 77, 80, 95, 99, 115, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [25, 26, 31, 35, 39, 44, 53, 58, 65, 79, 81, 83, 88, 94, 95, 118, 121, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3110', '1.800', '0.1645', '1.800', '0.0968', '7.000', '0.7076', 1, 1, 1, 1, 1724710417.3154798]
VI_after__Init : ['1.201', '0.3114', '1.800', '0.1646', '1.801', '0.0908', '7.000', '0.7074', 1, 1, 1, 1, 1724710425.3769145]
VI_at__the_End : ['1.201', '0.4960', '1.800', '0.1359', '1.808', '0.1124', '7.000', '0.7085', 1, 1, 1, 1, 1724710485.498213]