TEST_NAME : Wafer
TEST_DATE : 24_08_27-00_37_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-017-008-09 | FUSED_ID : 6359364768386584713
  IC_TEMP :  -55.55 | VDDM : 1127.85 | AUX_INT :   -8.97 | CsaBias :   76.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31889e-03 / 2
  ADC_P0  : -8.96515e-03 ± 2.46051e-02
  ADC_P1  : 8.58394e-03 ± 6.16605e-04
  ADC_P2  : -6.09993e-06 ± 3.07179e-06
  CSA_Chi2/NDF : 1.46066e-04 / 2
  CSA_P0  : 5.83045e-02 ± 8.06116e-03
  CSA_P1  : 9.50827e-03 ± 6.07350e-04
  CSA_P2  : -4.26238e-05 ± 9.24923e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [32, 50, 57, 77, 80, 97, 101, 124, 126, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [19, 23, 28, 36, 39, 43, 72, 73, 82, 102, 109, 117, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3128', '1.800', '0.1114', '1.800', '0.0884', '7.000', '0.7076', 1, 1, 1, 1, 1724711854.804466]
VI_after__Init : ['1.201', '0.3131', '1.800', '0.1114', '1.800', '0.0825', '7.000', '0.7075', 1, 1, 1, 1, 1724711862.8968601]
VI_at__the_End : ['1.201', '0.4854', '1.800', '0.1343', '1.799', '0.1129', '7.000', '0.7084', 1, 1, 1, 1, 1724711922.8142323]