TEST_NAME : Wafer
TEST_DATE : 24_08_27-00_29_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-017-013-09 | FUSED_ID : 6359364768386584793
  IC_TEMP :  -56.50 | VDDM : 1124.32 | AUX_INT :   -9.69 | CsaBias :   73.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.70615e-03 / 2
  ADC_P0  : -9.69038e-03 ± 2.80490e-02
  ADC_P1  : 8.34267e-03 ± 6.86428e-04
  ADC_P2  : -5.51438e-06 ± 3.34527e-06
  CSA_Chi2/NDF : 1.52790e-04 / 2
  CSA_P0  : 5.90332e-02 ± 8.24459e-03
  CSA_P1  : 1.01405e-02 ± 6.21171e-04
  CSA_P2  : -5.01933e-05 ± 9.45969e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [20, 22, 31, 32, 33, 34, 36, 49, 61, 69, 75, 85, 88, 96, 97, 109, 116, 117, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [1, 2, 12, 22, 28, 31, 39, 42, 59, 86, 90, 104, 109, 117, 119, 121, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3348', '1.800', '0.1276', '1.800', '0.0904', '7.000', '0.7077', 1, 1, 1, 1, 1724711376.1427243]
VI_after__Init : ['1.201', '0.3349', '1.800', '0.1277', '1.800', '0.0845', '7.000', '0.7074', 1, 1, 1, 1, 1724711384.2562292]
VI_at__the_End : ['1.201', '0.4935', '1.800', '0.1354', '1.800', '0.1132', '7.000', '0.7083', 1, 1, 1, 1, 1724711444.952507]