TEST_NAME : Wafer
TEST_DATE : 24_08_27-00_28_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-017-014-09 | FUSED_ID : 6359364768386584809
  IC_TEMP :  -52.07 | VDDM : 1127.00 | AUX_INT :   -9.60 | CsaBias :   66.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39836e-03 / 2
  ADC_P0  : -9.60035e-03 ± 2.53076e-02
  ADC_P1  : 8.47279e-03 ± 6.17762e-04
  ADC_P2  : -6.26263e-06 ± 3.00103e-06
  CSA_Chi2/NDF : 1.23060e-04 / 2
  CSA_P0  : 5.83462e-02 ± 7.39913e-03
  CSA_P1  : 9.58412e-03 ± 5.57471e-04
  CSA_P2  : -4.28448e-05 ± 8.48962e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [18, 29, 59, 61, 67, 73, 85, 105, 108, 112, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [6, 12, 19, 24, 28, 33, 36, 61, 64, 66, 72, 74, 83, 87, 88, 91, 92, 94, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3501', '1.800', '0.1613', '1.800', '0.0964', '7.000', '0.7075', 1, 1, 1, 1, 1724711279.7732728]
VI_after__Init : ['1.201', '0.3502', '1.799', '0.1614', '1.800', '0.0907', '7.000', '0.7077', 1, 1, 1, 1, 1724711287.9526536]
VI_at__the_End : ['1.201', '0.4895', '1.802', '0.1387', '1.800', '0.1118', '7.000', '0.7085', 1, 1, 1, 1, 1724711356.0103807]