TEST_NAME : Wafer
TEST_DATE : 24_08_27-00_24_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-017-016-14 | FUSED_ID : 6359364768386584846
  IC_TEMP :  -55.28 | VDDM : 1127.91 | AUX_INT :   -6.95 | CsaBias :   75.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.54764e-04 / 2
  ADC_P0  : -6.95133e-03 ± 2.09368e-02
  ADC_P1  : 8.27082e-03 ± 5.16009e-04
  ADC_P2  : -5.29361e-06 ± 2.51632e-06
  CSA_Chi2/NDF : 1.08491e-04 / 2
  CSA_P0  : 5.79143e-02 ± 6.94734e-03
  CSA_P1  : 9.46932e-03 ± 5.23432e-04
  CSA_P2  : -4.09497e-05 ± 7.97125e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [4, 20, 21, 22, 24, 26, 32, 35, 53, 56, 73, 76, 85, 89, 106, 112, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [40, 49, 54, 101, 104, 112, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1884', '1.800', '0.1720', '1.800', '0.0824', '7.000', '0.7079', 1, 1, 1, 1, 1724711088.1919663]
VI_after__Init : ['1.201', '0.1885', '1.800', '0.1721', '1.800', '0.0767', '7.000', '0.7076', 1, 1, 1, 1, 1724711096.2223613]
VI_at__the_End : ['1.201', '0.4873', '1.799', '0.1377', '1.799', '0.1127', '7.000', '0.7084', 1, 1, 1, 1, 1724711156.3466961]