TEST_NAME : Wafer
TEST_DATE : 24_08_27-00_42_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-018-010-07 | FUSED_ID : 6359364768386588839
  IC_TEMP :  -63.18 | VDDM : 1153.06 | AUX_INT : -312.96 | CsaBias : -158.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38385e-03 / 2
  ADC_P0  : -3.12959e-01 ± 4.28684e-02
  ADC_P1  : 1.31728e-02 ± 9.72737e-04
  ADC_P2  : -2.23741e-05 ± 4.35950e-06
  CSA_Chi2/NDF : 1.92818e-04 / 2
  CSA_P0  : 5.72242e-02 ± 9.26181e-03
  CSA_P1  : 9.99465e-03 ± 6.97811e-04
  CSA_P2  : -4.85330e-05 ± 1.06268e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [8, 12, 23, 31, 33, 77, 87, 88, 105, 107, 108, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [8, 11, 20, 35, 42, 45, 55, 61, 71, 76, 85, 86, 91, 101, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2477', '1.800', '0.1382', '1.800', '0.0871', '7.000', '0.7076', 1, 1, 1, 1, 1724712141.5487032]
VI_after__Init : ['1.201', '0.2477', '1.800', '0.1382', '1.800', '0.0812', '7.000', '0.7076', 1, 1, 1, 1, 1724712150.315979]
VI_at__the_End : ['1.201', '0.4899', '1.800', '0.1336', '1.801', '0.1134', '7.000', '0.7083', 1, 1, 1, 1, 1724712209.918424]