TEST_NAME : Wafer
TEST_DATE : 24_08_27-00_55_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-018-018-00 | FUSED_ID : 6359364768386588960
  IC_TEMP :  -61.33 | VDDM : 1123.27 | AUX_INT :  -36.16 | CsaBias :   49.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72173e-03 / 2
  ADC_P0  : -3.61633e-02 ± 2.96533e-02
  ADC_P1  : 8.61744e-03 ± 7.05258e-04
  ADC_P2  : -6.79357e-06 ± 3.32940e-06
  CSA_Chi2/NDF : 1.69762e-04 / 2
  CSA_P0  : 5.94237e-02 ± 8.69044e-03
  CSA_P1  : 1.01030e-02 ± 6.54762e-04
  CSA_P2  : -5.04691e-05 ± 9.97125e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [12, 18, 19, 23, 25, 28, 38, 54, 63, 66, 74, 76, 83, 85, 100, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [2, 53, 56, 57, 65, 66, 69, 73, 94, 99, 105, 109, 113, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2694', '1.800', '0.1438', '1.799', '0.0888', '7.000', '0.7077', 1, 1, 1, 1, 1724712908.5721385]
VI_after__Init : ['1.201', '0.2695', '1.800', '0.1439', '1.801', '0.0831', '7.000', '0.7075', 1, 1, 1, 1, 1724712917.4273407]
VI_at__the_End : ['1.201', '0.4912', '1.800', '0.1361', '1.799', '0.1146', '7.000', '0.7083', 1, 1, 1, 1, 1724712976.250865]