TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_25_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-002-010-10 | FUSED_ID : 6359364768387571882
  IC_TEMP : -133.75 | VDDM : 1116.56 | AUX_INT :  -12.64 | CsaBias :   23.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.20178e-03 / 2
  ADC_P0  : -1.26384e-02 ± 3.16924e-02
  ADC_P1  : 9.10644e-03 ± 7.89256e-04
  ADC_P2  : -8.78318e-06 ± 3.91351e-06
  CSA_Chi2/NDF : 4.06127e-05 / 2
  CSA_P0  : 5.80787e-02 ± 4.25063e-03
  CSA_P1  : 9.72243e-03 ± 3.20254e-04
  CSA_P2  : -8.11281e-05 ± 4.87710e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [1, 19, 63, 66, 70, 76, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [9, 13, 23, 35, 46, 110, 113, 114, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['0.000', '0.0002', '0.432', '0.0400', '0.323', '0.0175', '7.000', '0.7072', 1, 1, 1, 1, 1724765099.583484]
VI_after__Init : ['1.201', '0.2619', '1.800', '0.1495', '1.799', '0.0908', '7.000', '0.7072', 1, 1, 1, 1, 1724765108.353738]
VI_at__the_End : ['1.181', '0.3418', '1.800', '0.1301', '1.800', '0.1181', '7.000', '0.7080', 1, 1, 1, 1, 1724765165.681453]