TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_29_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-002-019-13 | FUSED_ID : 6359364768387572029
  IC_TEMP : -104.33 | VDDM : 1095.36 | AUX_INT :  -14.25 | CsaBias :   30.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.34285e-03 / 2
  ADC_P0  : -1.42543e-02 ± 3.94271e-02
  ADC_P1  : 9.07384e-03 ± 1.05337e-03
  ADC_P2  : -5.05833e-06 ± 5.73266e-06
  CSA_Chi2/NDF : 6.94555e-05 / 2
  CSA_P0  : 6.00786e-02 ± 5.55873e-03
  CSA_P1  : 1.03884e-02 ± 4.18810e-04
  CSA_P2  : -8.17629e-05 ± 6.37799e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [32, 74, 101, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [3, 65, 68, 82, 83, 103, 113, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1817', '1.800', '0.1162', '1.800', '0.0910', '7.000', '0.7073', 1, 1, 1, 1, 1724765386.2953997]
VI_after__Init : ['1.202', '0.1821', '1.800', '0.1163', '1.800', '0.0855', '7.000', '0.7072', 1, 1, 1, 1, 1724765394.213758]
VI_at__the_End : ['1.181', '0.3802', '1.800', '0.1336', '1.799', '0.1140', '7.000', '0.7082', 1, 1, 1, 1, 1724765452.685293]