TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_46_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-004-009-15 | FUSED_ID : 6359364768387580063
  IC_TEMP :  -82.38 | VDDM : 1109.35 | AUX_INT :  -12.92 | CsaBias :   50.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.41442e-03 / 2
  ADC_P0  : -1.29199e-02 ± 3.32988e-02
  ADC_P1  : 9.06692e-03 ± 8.49670e-04
  ADC_P2  : -7.50500e-06 ± 4.34997e-06
  CSA_Chi2/NDF : 1.46872e-04 / 2
  CSA_P0  : 5.87771e-02 ± 8.08336e-03
  CSA_P1  : 1.05249e-02 ± 6.09023e-04
  CSA_P2  : -7.18981e-05 ± 9.27470e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [17, 22, 42, 48, 74, 98, 109, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [27, 45, 51, 89, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2441', '1.800', '0.1503', '1.800', '0.0322', '7.000', '0.7061', 1, 1, 1, 1, 1724755583.3199072]
VI_after__Init : ['1.201', '0.2449', '1.800', '0.1504', '1.800', '0.0849', '7.000', '0.7080', 1, 1, 1, 1, 1724755591.3963008]
VI_at__the_End : ['1.201', '0.4328', '1.800', '0.1335', '1.800', '0.1172', '7.000', '0.7085', 1, 1, 1, 1, 1724755660.547943]