TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_47_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-004-010-15 | FUSED_ID : 6359364768387580079
  IC_TEMP :  -78.94 | VDDM : 1112.60 | AUX_INT :  -11.53 | CsaBias :   58.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.92659e-03 / 2
  ADC_P0  : -1.15306e-02 ± 2.97346e-02
  ADC_P1  : 8.75737e-03 ± 7.44311e-04
  ADC_P2  : -6.60345e-06 ± 3.73198e-06
  CSA_Chi2/NDF : 1.69663e-04 / 2
  CSA_P0  : 5.78466e-02 ± 8.68792e-03
  CSA_P1  : 9.95897e-03 ± 6.54572e-04
  CSA_P2  : -6.31417e-05 ± 9.96836e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [1, 2, 5, 14, 17, 30, 48, 56, 57, 73]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [11, 40, 46, 61, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.0972', '1.800', '0.1169', '1.800', '0.0805', '7.000', '0.7079', 1, 1, 1, 1, 1724755679.213564]
VI_after__Init : ['1.202', '0.0972', '1.800', '0.1170', '1.800', '0.0751', '7.000', '0.7079', 1, 1, 1, 1, 1724755687.2579536]
VI_at__the_End : ['1.201', '0.4302', '1.800', '0.1339', '1.800', '0.1167', '7.000', '0.7086', 1, 1, 1, 1, 1724755754.6957638]