TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_49_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-004-011-15 | FUSED_ID : 6359364768387580095
  IC_TEMP :  -74.31 | VDDM : 1102.18 | AUX_INT :  -10.26 | CsaBias :   65.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63207e-03 / 2
  ADC_P0  : -1.02618e-02 ± 2.73992e-02
  ADC_P1  : 8.48998e-03 ± 6.79188e-04
  ADC_P2  : -5.64115e-06 ± 3.36845e-06
  CSA_Chi2/NDF : 1.78039e-04 / 2
  CSA_P0  : 5.71674e-02 ± 8.89980e-03
  CSA_P1  : 9.87440e-03 ± 6.70536e-04
  CSA_P2  : -6.13221e-05 ± 1.02115e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [33, 52, 59, 85, 107, 114, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [37, 44]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2522', '1.800', '0.1373', '1.800', '0.0892', '7.000', '0.7077', 1, 1, 1, 1, 1724755774.4502418]
VI_after__Init : ['1.201', '0.2523', '1.800', '0.1373', '1.800', '0.0838', '7.000', '0.7079', 1, 1, 1, 1, 1724755783.4065135]
VI_at__the_End : ['1.201', '0.4312', '1.800', '0.1306', '1.800', '0.1166', '7.000', '0.7088', 1, 1, 1, 1, 1724755843.1880543]