TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_52_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-004-013-15 | FUSED_ID : 6359364768387580127
  IC_TEMP :  -71.72 | VDDM : 1119.98 | AUX_INT :  -10.67 | CsaBias :   51.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75515e-03 / 2
  ADC_P0  : -1.06657e-02 ± 2.84130e-02
  ADC_P1  : 8.85914e-03 ± 7.30724e-04
  ADC_P2  : -6.31571e-06 ± 3.76069e-06
  CSA_Chi2/NDF : 1.59667e-04 / 2
  CSA_P0  : 5.80987e-02 ± 8.42810e-03
  CSA_P1  : 1.01240e-02 ± 6.34997e-04
  CSA_P2  : -6.25993e-05 ± 9.67025e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [18, 21, 52, 58, 62, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [12, 32, 53, 70, 73, 83, 84, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1293', '1.800', '0.1335', '1.800', '0.0833', '7.000', '0.7086', 1, 1, 1, 1, 1724755966.8933709]
VI_after__Init : ['1.202', '0.1293', '1.800', '0.1335', '1.800', '0.0762', '7.000', '0.7080', 1, 1, 1, 1, 1724755974.8419075]
VI_at__the_End : ['1.201', '0.4422', '1.800', '0.1323', '1.800', '0.1153', '7.000', '0.7087', 1, 1, 1, 1, 1724756042.665721]