TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_35_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-005-009-02 | FUSED_ID : 6359364768387584146
  IC_TEMP :  -72.01 | VDDM : 1118.53 | AUX_INT :   -9.19 | CsaBias :   51.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26146e-03 / 2
  ADC_P0  : -9.19308e-03 ± 2.40155e-02
  ADC_P1  : 8.76648e-03 ± 6.05718e-04
  ADC_P2  : -6.82128e-06 ± 3.03662e-06
  CSA_Chi2/NDF : 1.73576e-04 / 2
  CSA_P0  : 5.80922e-02 ± 8.78753e-03
  CSA_P1  : 1.00977e-02 ± 6.62077e-04
  CSA_P2  : -5.99879e-05 ± 1.00826e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 23, 39, 112, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [4, 7, 32, 42, 47, 48, 63, 93, 94, 119, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2177', '1.800', '0.1541', '1.800', '0.0907', '7.000', '0.7079', 1, 1, 1, 1, 1724758549.6639383]
VI_after__Init : ['1.202', '0.2177', '1.800', '0.1542', '1.800', '0.0832', '7.000', '0.7072', 1, 1, 1, 1, 1724758558.3671887]
VI_at__the_End : ['1.201', '0.4487', '1.800', '0.1366', '1.799', '0.1173', '7.000', '0.7078', 1, 1, 1, 1, 1724758625.2358332]