TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_27_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x3 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-005-014-02 | FUSED_ID : 6359364768387584226
  IC_TEMP :  -68.06 | VDDM : 1123.46 | AUX_INT :   -9.62 | CsaBias :   60.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43965e-03 / 2
  ADC_P0  : -9.62462e-03 ± 2.57044e-02
  ADC_P1  : 8.78654e-03 ± 6.56485e-04
  ADC_P2  : -6.37419e-06 ± 3.34253e-06
  CSA_Chi2/NDF : 1.48251e-04 / 2
  CSA_P0  : 5.74475e-02 ± 8.12121e-03
  CSA_P1  : 9.94671e-03 ± 6.11875e-04
  CSA_P2  : -5.87534e-05 ± 9.31813e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [14, 33, 52, 77, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [7, 15, 52, 92, 102, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0723', '1.800', '0.1193', '1.799', '0.0877', '7.000', '0.7079', 1, 1, 1, 1, 1724758071.3555412]
VI_after__Init : ['1.202', '0.0724', '1.800', '0.1194', '1.805', '0.0807', '7.000', '0.7071', 1, 1, 1, 1, 1724758079.4348578]
VI_at__the_End : ['1.201', '0.4474', '1.800', '0.1350', '1.807', '0.1167', '7.000', '0.7079', 1, 1, 1, 1, 1724758147.2316718]