TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_21_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-005-018-05 | FUSED_ID : 6359364768387584293
  IC_TEMP :  -70.85 | VDDM : 1123.04 | AUX_INT :  -10.50 | CsaBias :   60.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74206e-03 / 2
  ADC_P0  : -1.04986e-02 ± 2.82976e-02
  ADC_P1  : 8.87313e-03 ± 7.25312e-04
  ADC_P2  : -6.61739e-06 ± 3.71092e-06
  CSA_Chi2/NDF : 1.82120e-04 / 2
  CSA_P0  : 5.71043e-02 ± 9.00122e-03
  CSA_P1  : 1.00789e-02 ± 6.78177e-04
  CSA_P2  : -6.20645e-05 ± 1.03278e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [13, 17, 40, 41, 44, 108, 123, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3682', '1.800', '0.1445', '1.800', '0.0956', '7.000', '0.7073', 1, 1, 1, 1, 1724757693.2182229]
VI_after__Init : ['1.201', '0.3685', '1.800', '0.1448', '1.800', '0.0901', '7.000', '0.7072', 1, 1, 1, 1, 1724757701.2906747]
VI_at__the_End : ['1.201', '0.4432', '1.800', '0.1358', '1.800', '0.1172', '7.000', '0.7077', 1, 1, 1, 1, 1724757763.4038935]