TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_19_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-005-019-05 | FUSED_ID : 6359364768387584309
  IC_TEMP :  -71.77 | VDDM : 1120.41 | AUX_INT :  -12.56 | CsaBias :   58.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.64335e-03 / 2
  ADC_P0  : -1.25566e-02 ± 3.49621e-02
  ADC_P1  : 8.88482e-03 ± 8.94706e-04
  ADC_P2  : -6.38138e-06 ± 4.59714e-06
  CSA_Chi2/NDF : 1.81189e-04 / 2
  CSA_P0  : 5.80385e-02 ± 8.97818e-03
  CSA_P1  : 1.01266e-02 ± 6.76441e-04
  CSA_P2  : -6.08652e-05 ± 1.03014e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [21, 47, 56, 63, 85, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [17, 51, 54, 66, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3213', '1.800', '0.1878', '1.800', '0.0933', '7.000', '0.7079', 1, 1, 1, 1, 1724757597.1565368]
VI_after__Init : ['1.201', '0.3216', '1.800', '0.1878', '1.800', '0.0857', '7.000', '0.7072', 1, 1, 1, 1, 1724757605.8828943]
VI_at__the_End : ['1.201', '0.4497', '1.800', '0.1365', '1.799', '0.1167', '7.000', '0.7080', 1, 1, 1, 1, 1724757664.6154103]