TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_11_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-005-024-05 | FUSED_ID : 6359364768387584389
  IC_TEMP :  -78.65 | VDDM : 1122.13 | AUX_INT :  -10.28 | CsaBias :   52.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.70826e-03 / 2
  ADC_P0  : -1.02802e-02 ± 2.80325e-02
  ADC_P1  : 9.02808e-03 ± 7.34337e-04
  ADC_P2  : -6.71023e-06 ± 3.83860e-06
  CSA_Chi2/NDF : 1.73566e-04 / 2
  CSA_P0  : 5.81152e-02 ± 8.78728e-03
  CSA_P1  : 1.07733e-02 ± 6.62058e-04
  CSA_P2  : -7.14201e-05 ± 1.00824e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 36, 85, 87, 95, 101, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [4, 41, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3525', '1.800', '0.1382', '1.800', '0.0923', '7.000', '0.7074', 1, 1, 1, 1, 1724757117.6978037]
VI_after__Init : ['1.201', '0.3534', '1.800', '0.1384', '1.800', '0.0863', '7.000', '0.7076', 1, 1, 1, 1, 1724757125.9272244]
VI_at__the_End : ['1.201', '0.4490', '1.800', '0.1348', '1.805', '0.1181', '7.000', '0.7081', 1, 1, 1, 1, 1724757187.2945137]