TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_10_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-005-025-05 | FUSED_ID : 6359364768387584405
  IC_TEMP :  -78.49 | VDDM : 1117.76 | AUX_INT :  -12.27 | CsaBias :   50.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.25763e-03 / 2
  ADC_P0  : -1.22696e-02 ± 3.22245e-02
  ADC_P1  : 9.01113e-03 ± 8.26985e-04
  ADC_P2  : -7.06899e-06 ± 4.25540e-06
  CSA_Chi2/NDF : 1.69729e-04 / 2
  CSA_P0  : 5.79749e-02 ± 8.68962e-03
  CSA_P1  : 1.06077e-02 ± 6.54700e-04
  CSA_P2  : -7.00513e-05 ± 9.97031e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [6, 9, 22, 71, 77, 91, 98, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [57, 75, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2523', '1.800', '0.1078', '1.800', '0.0933', '7.000', '0.7076', 1, 1, 1, 1, 1724757022.1779947]
VI_after__Init : ['1.201', '0.2526', '1.800', '0.1079', '1.800', '0.0877', '7.000', '0.7075', 1, 1, 1, 1, 1724757030.3763711]
VI_at__the_End : ['1.201', '0.4426', '1.800', '0.1339', '1.801', '0.1144', '7.000', '0.7084', 1, 1, 1, 1, 1724757097.5373702]