TEST_NAME : Wafer
TEST_DATE : 24_08_27-14_06_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x3 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-006-016-11 | FUSED_ID : 6359364768387588363
  IC_TEMP :  -62.25 | VDDM : 1120.14 | AUX_INT :  -19.78 | CsaBias :   52.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.86843e-03 / 2
  ADC_P0  : -1.97837e-02 ± 2.98367e-02
  ADC_P1  : 9.13861e-03 ± 7.64901e-04
  ADC_P2  : -7.82368e-06 ± 3.89278e-06
  CSA_Chi2/NDF : 1.54406e-04 / 2
  CSA_P0  : 6.05331e-02 ± 8.28809e-03
  CSA_P1  : 9.89272e-03 ± 6.24447e-04
  CSA_P2  : -5.43635e-05 ± 9.50960e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [42, 84, 91, 104, 114, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [18, 70, 81, 102, 115, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2070', '1.800', '0.1957', '1.800', '0.0903', '7.000', '0.7067', 1, 1, 1, 1, 1724760365.4877782]
VI_after__Init : ['1.201', '0.2071', '1.800', '0.1958', '1.800', '0.0849', '7.000', '0.7068', 1, 1, 1, 1, 1724760374.3900912]
VI_at__the_End : ['1.201', '0.4619', '1.800', '0.1361', '1.800', '0.1163', '7.000', '0.7076', 1, 1, 1, 1, 1724760437.642098]