TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_59_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-007-013-01 | FUSED_ID : 6359364768387592401
  IC_TEMP : -105.77 | VDDM : 1114.13 | AUX_INT :  -15.33 | CsaBias :   39.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.65116e-03 / 2
  ADC_P0  : -1.53311e-02 ± 4.11158e-02
  ADC_P1  : 9.23720e-03 ± 1.07775e-03
  ADC_P2  : -6.85544e-06 ± 5.73124e-06
  CSA_Chi2/NDF : 8.08941e-05 / 2
  CSA_P0  : 5.72152e-02 ± 5.99903e-03
  CSA_P1  : 1.02435e-02 ± 4.51983e-04
  CSA_P2  : -8.06154e-05 ± 6.88317e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 7, 45, 90, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [44, 45, 55, 62, 67, 85, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2264', '1.800', '0.1495', '1.800', '0.0937', '7.000', '0.7073', 1, 1, 1, 1, 1724767179.3541496]
VI_after__Init : ['1.201', '0.2268', '1.800', '0.1502', '1.800', '0.0880', '7.000', '0.7076', 1, 1, 1, 1, 1724767187.5195453]
VI_at__the_End : ['1.201', '0.3826', '1.800', '0.1318', '1.800', '0.1204', '7.000', '0.7081', 1, 1, 1, 1, 1724767239.8435793]