TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_40_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-007-025-06 | FUSED_ID : 6359364768387592598
  IC_TEMP :  -94.09 | VDDM : 1100.80 | AUX_INT :  -14.62 | CsaBias :   31.09
  CONF_FAIL_REG : 33
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.43262e-03 / 2
  ADC_P0  : -1.46223e-02 ± 3.98966e-02
  ADC_P1  : 9.17342e-03 ± 1.05202e-03
  ADC_P2  : -6.33838e-06 ± 5.62427e-06
  CSA_Chi2/NDF : 1.93698e-04 / 2
  CSA_P0  : 5.58297e-02 ± 9.28293e-03
  CSA_P1  : 1.02660e-02 ± 6.99402e-04
  CSA_P2  : -7.80938e-05 ± 1.06511e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 43, 63, 67, 78, 108, 111, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [4, 33, 59, 60, 62, 83, 88, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2971', '1.800', '0.1503', '1.800', '0.1005', '7.000', '0.7072', 1, 1, 1, 1, 1724766033.8214612]
VI_after__Init : ['1.201', '0.2987', '1.800', '0.1512', '1.800', '0.0950', '7.000', '0.7075', 1, 1, 1, 1, 1724766041.518833]
VI_at__the_End : ['1.201', '0.3952', '1.800', '0.1302', '1.800', '0.1188', '7.000', '0.7083', 1, 1, 1, 1, 1724766105.5699327]