TEST_NAME : Wafer
TEST_DATE : 24_08_27-16_29_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-008-010-05 | FUSED_ID : 6359364768387596453
  IC_TEMP : -100.52 | VDDM : 1103.02 | AUX_INT :  -15.02 | CsaBias :   38.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.30641e-03 / 2
  ADC_P0  : -1.50245e-02 ± 3.90384e-02
  ADC_P1  : 9.04461e-03 ± 9.88554e-04
  ADC_P2  : -7.20253e-06 ± 5.06150e-06
  CSA_Chi2/NDF : 8.53715e-05 / 2
  CSA_P0  : 5.86597e-02 ± 6.16281e-03
  CSA_P1  : 1.01187e-02 ± 4.64323e-04
  CSA_P2  : -7.61258e-05 ± 7.07110e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [52, 66, 99, 104, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [28, 38, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3342', '1.800', '0.1532', '1.800', '0.0947', '7.000', '0.7069', 1, 1, 1, 1, 1724768994.3344543]
VI_after__Init : ['1.201', '0.3394', '1.800', '0.1555', '1.800', '0.0894', '7.000', '0.7070', 1, 1, 1, 1, 1724769002.6249352]
VI_at__the_End : ['1.201', '0.3898', '1.800', '0.1340', '1.800', '0.1188', '7.000', '0.7075', 1, 1, 1, 1, 1724769064.652181]