TEST_NAME : Wafer
TEST_DATE : 24_08_27-16_37_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-008-015-05 | FUSED_ID : 6359364768387596533
  IC_TEMP :  -73.85 | VDDM : 1131.73 | AUX_INT :   -8.00 | CsaBias :   36.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.96413e-04 / 2
  ADC_P0  : -8.00280e-03 ± 2.13409e-02
  ADC_P1  : 9.01122e-03 ± 5.60045e-04
  ADC_P2  : -6.93592e-06 ± 2.91507e-06
  CSA_Chi2/NDF : 1.60799e-04 / 2
  CSA_P0  : 6.03608e-02 ± 8.45792e-03
  CSA_P1  : 1.06301e-02 ± 6.37243e-04
  CSA_P2  : -6.74017e-05 ± 9.70446e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [23, 26, 27, 74, 76, 84, 104, 107, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [22, 35, 83, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3158', '1.800', '0.1732', '1.800', '0.0949', '7.000', '0.7071', 1, 1, 1, 1, 1724769474.3903005]
VI_after__Init : ['1.201', '0.3162', '1.800', '0.1739', '1.800', '0.0897', '7.001', '0.7069', 1, 1, 1, 1, 1724769482.4077258]
VI_at__the_End : ['1.201', '0.4575', '1.800', '0.1384', '1.800', '0.1187', '7.000', '0.7076', 1, 1, 1, 1, 1724769550.449516]