TEST_NAME : Wafer
TEST_DATE : 24_08_27-16_50_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-008-023-02 | FUSED_ID : 6359364768387596658
  IC_TEMP :  -60.08 | VDDM : 1126.74 | AUX_INT :   -7.54 | CsaBias :   60.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.47346e-04 / 2
  ADC_P0  : -7.53598e-03 ± 2.07918e-02
  ADC_P1  : 8.50113e-03 ± 5.11287e-04
  ADC_P2  : -6.55209e-06 ± 2.48334e-06
  CSA_Chi2/NDF : 1.60589e-04 / 2
  CSA_P0  : 6.01636e-02 ± 8.45240e-03
  CSA_P1  : 9.90478e-03 ± 6.36828e-04
  CSA_P2  : -4.99376e-05 ± 9.69813e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [20, 26, 36, 37, 47, 54, 66, 88, 98, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [3, 5, 25, 48, 64, 121, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3480', '1.800', '0.1519', '1.800', '0.0924', '7.000', '0.7069', 1, 1, 1, 1, 1724770242.0401561]
VI_after__Init : ['1.201', '0.3482', '1.800', '0.1520', '1.800', '0.0866', '7.000', '0.7069', 1, 1, 1, 1, 1724770250.1625457]
VI_at__the_End : ['1.201', '0.4792', '1.800', '0.1362', '1.800', '0.1131', '7.000', '0.7079', 1, 1, 1, 1, 1724770317.5733583]