TEST_NAME : Wafer
TEST_DATE : 24_08_27-16_52_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-008-024-02 | FUSED_ID : 6359364768387596674
  IC_TEMP :  -59.66 | VDDM : 1127.54 | AUX_INT :   -9.49 | CsaBias :   74.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37677e-03 / 2
  ADC_P0  : -9.49114e-03 ± 2.51115e-02
  ADC_P1  : 8.49121e-03 ± 6.12974e-04
  ADC_P2  : -6.36562e-06 ± 2.97777e-06
  CSA_Chi2/NDF : 1.83941e-04 / 2
  CSA_P0  : 5.99611e-02 ± 9.04611e-03
  CSA_P1  : 1.03326e-02 ± 6.81559e-04
  CSA_P2  : -5.47319e-05 ± 1.03793e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [21, 85, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 15, 24, 34, 58, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3690', '1.800', '0.1332', '1.800', '0.0892', '7.000', '0.7072', 1, 1, 1, 1, 1724770337.7238808]
VI_after__Init : ['1.202', '0.3700', '1.800', '0.1333', '1.799', '0.0835', '7.000', '0.7072', 1, 1, 1, 1, 1724770345.7872086]
VI_at__the_End : ['1.202', '0.4890', '1.800', '0.1377', '1.800', '0.1148', '7.000', '0.7076', 1, 1, 1, 1, 1724770413.3751712]