TEST_NAME : Wafer
TEST_DATE : 24_08_27-17_41_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-010-003-06 | FUSED_ID : 6359364768387604534
  IC_TEMP :  -62.15 | VDDM : 1132.64 | AUX_INT :   -8.34 | CsaBias :   68.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30981e-03 / 2
  ADC_P0  : -8.34083e-03 ± 2.45315e-02
  ADC_P1  : 8.56188e-03 ± 6.16126e-04
  ADC_P2  : -6.06893e-06 ± 3.06650e-06
  CSA_Chi2/NDF : 1.80901e-04 / 2
  CSA_P0  : 5.73110e-02 ± 8.97104e-03
  CSA_P1  : 1.04961e-02 ± 6.75903e-04
  CSA_P2  : -5.73992e-05 ± 1.02932e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [15, 19, 27, 31, 71, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [18, 82, 95, 123, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4405', '1.800', '0.1567', '1.799', '0.0957', '7.000', '0.7072', 1, 1, 1, 1, 1724773302.4701834]
VI_after__Init : ['1.201', '0.4410', '1.800', '0.1568', '1.800', '0.0899', '7.000', '0.7071', 1, 1, 1, 1, 1724773310.5755532]
VI_at__the_End : ['1.201', '0.4858', '1.800', '0.1396', '1.800', '0.1155', '7.000', '0.7075', 1, 1, 1, 1, 1724773371.5219097]