TEST_NAME : Wafer
TEST_DATE : 24_08_27-17_43_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-010-004-06 | FUSED_ID : 6359364768387604550
  IC_TEMP :  -67.94 | VDDM : 1123.46 | AUX_INT :   -7.54 | CsaBias :   46.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14103e-03 / 2
  ADC_P0  : -7.53932e-03 ± 2.28856e-02
  ADC_P1  : 9.00888e-03 ± 6.07734e-04
  ADC_P2  : -6.64491e-06 ± 3.19188e-06
  CSA_Chi2/NDF : 1.80812e-04 / 2
  CSA_P0  : 6.10118e-02 ± 8.96883e-03
  CSA_P1  : 1.08959e-02 ± 6.75737e-04
  CSA_P2  : -6.67688e-05 ± 1.02907e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [41, 43, 47, 89, 92, 95, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [28, 60, 85, 94, 110, 112, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3299', '1.800', '0.1415', '1.800', '0.0971', '7.000', '0.7069', 1, 1, 1, 1, 1724773397.9369266]
VI_after__Init : ['1.201', '0.3300', '1.800', '0.1416', '1.800', '0.0910', '7.000', '0.7071', 1, 1, 1, 1, 1724773406.0533464]
VI_at__the_End : ['1.201', '0.4753', '1.800', '0.1415', '1.802', '0.1179', '7.000', '0.7076', 1, 1, 1, 1, 1724773474.2632878]